| 摘要: |
| 静态随机存储器(Static Random Access Memory, SRAM)型现场可编程门阵列（Field Programmable Gate Array, FPGA）广泛应用于航空航天系统中，但是高空中FPGA易受高能粒子影响造成配置出错，互联资源上发生的单点错误可能导致跨域故障，使芯片内多个模块同时失效。跨域故障可能导致电路中的工作模块与检错模块同时故障，使设备中存在不能被检测到的隐蔽故障。针对上述问题，提出在芯片上将不同功能的模块相互隔离，并通过约束实现模块间可信通信的故障隔离方法，将故障限定在单一模块内，防止多个模块同时失效，提高电路的容错能力。通过故障注入评估隔离设计前后的航空电子全双工交换式以太网（Avionics Full Duplex Switched Ethernet, AFDX）电路的各类故障发生率。实验结果证明隔离设计可以与电路原有的检错容错机制结合，将隐蔽故障的发生率降为原来的3%。 |
| 关键词: AFDX 功能域隔离电路 跨域故障 隐蔽故障 |
| DOI：10.20079/j.issn.1001-893x.220922002 |
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| 基金项目:国家重点研发计划（2021YFB1600600）；中央高校基本科研业务费项目（XJ2021003601） |
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| Design of Functional Domain Isolation Circuit Based on FPGA |
| WANG Peng,LI Zihang,FAN Yuyang |
| (College of Safety Science and Engineering，Civil Aviation University of China, Tianjin 300300, China) |
| Abstract: |
| Static random access memory(SRAM) type field programmable gate array(FPGA) is widely used in aerospace and astrospace systems, but high-ltitude FPGAs are vulnerable to high-nergy particles that can cause configuration errors, and single-oint errors in interconnect resources can lead to cross-domain failures that can cause multiple modules within the chip to fail simultaneously. Cross-omain errors can lead to the simultaneous fault of both a working module and an error detection module in the circuit, leaving a hidden fault in the device that cannot be detected. In view of above problems, a fault isolation method is proposed, in which modules with different functions are isolated from each other on the chip, and trusted communication between modules is realized through constraints. The fault is limited to a single module, preventing multiple modules from failing at the same time, and improving the fault tolerance of the circuit. The occurrence rate of various faults in avionics full duplex switched Ethernet (AFDX) circuits before and after the isolation design is evaluated by fault injection. Experiments show that the isolation design can be combined with the original error detection and fault tolerance mechanism of the circuit to reduce the occurrence rate of hidden faults to 3 |
| Key words: AFDX functional domain isolation circuit cross-omain failure undetectable hidden fault |
