| 摘要: |
| 概述了VXI总线器件的分类，讨论了VXI总线消息基器件和寄存器基器件的特点，以及在测试系统中2种器件对测试吞吐量和程序设计的影响，并提出了优化测试系统的方案。 |
| 关键词: VXI总线 测试系统 优化方案 消息基器件 寄存器基器件 测试吞吐量 |
| DOI：10.3969/j.issn.1001-893X. |
| Revised:February 28, 2002 |
| 基金项目: |
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| Optimization Scheme of VXIbus Test System |
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| Abstract: |
| This paper summarizes the classification of VXIbus devices, then discusses the characteristics of VXIbus message-based and register-based devices, as well as the influence of these devices on system throughput and programming. Solutions to optimize the test system are presented. |
| Key words: Test system,VXIbus,Message-based device,Register-based device,Test throughput,Optimization |
