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摘要:

本文研究了低功耗集成运算放大器在可靠性筛选中出现的致命性失效现象,提取了必要的模型参数,藉助于Spicc-Ⅱ程序进行了失效现象的分析.模拟结果与实验的模式较为符合.

关键词: 运算放大器,失效现象分析,可靠性

DOI：

基金项目:

Deathful- Failure Phenomenon Analysis of An Integrated Operational Amplfier In Sieving Reliability

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Abstract:

Key words: Operational Amplifier,Failure Phenomenon,Reliability